Fourier Ptychographic Reflective Imaging SystemTechnology #ua16-060
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Title: Advanced Reflective Microscope
Invention: Researchers at the University of Arizona have designed a microscopic system that uses Fourier ptychography to relocate the illumination source and eliminate phase errors, offering significantly improved image quality. The design allows the user to employ smaller numerical aperture objectives while improving the field of view to acquire superior images.
Background: Normal microscopes are limited by the numerical aperture of the system, and by phase errors attributed to the illumination source, in their ability to resolve images of satisfactory quality.
- Industrial quality inspection
- Medical imaging
- Increases NA
- Decreases cost
- Increases quality of images
- Improves FOV
- Eliminates phase error