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System and Method for Determining 3-Dimensional Location of Defects in a Uniaxial Crystal
This invention is an optical inspection system that utilizes polarimetry, specialized illumination and imaging techniques to avoid the inaccuracies caused by image doubling, ray splitting, and defects shadowing each other. This novel inspection system greatly improves the accuracy in identifying the location of defects within boules of birefringent...
Published: 7/15/2022
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Inventor(s): Russell Chipman, Karlton Crabtree
Keywords(s): crystal, defect measurement, polarization
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
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