Search Results - junchao+zhang

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Method for 3D Nonlinear Structured Illumination Super-resolution Imaging
Researchers at the University of Arizona have developed a super-resolution microscopy method that is faster, easier to use, and has less artifacts than current super-resolution methods. The result is a 3D dual-color stimulated emission depletion (STED) nonlinear structured illumination (NL-SIM) microscope. Using a combination of low coherent light and...
Published: 7/15/2022   |   Inventor(s): Leilei Peng, Yu Li, Han Zhang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry
Microscopy for the Identification of Oxyhemoglobin Species in Red Blood Cells
This novel invention combines a Solid Immersion Lens (SIL) microscope with the Surface Plasmon Resonance (SPR) effect to achieve precise measurement of refractive index of a target, with high spatial resolution. When used to examine Red Blood Cells (RBC) at multiple wavelengths, the refractive index measurement yields the variation in oxygen content...
Published: 7/15/2022   |   Inventor(s): Thomas Milster, Kurt Denninghoff, Pramod Khulbe, Jun Zhang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Medical Imaging, Technology Classifications > Imaging & Optics
Phase Unwrapping by Neural Network
This technology is a novel method for phase unwrapping in optical imaging in a more efficient and accurate way. It uses unwrapping algorithms based on a transport of an intensity equation with a convolutional neural network to unwrap the phase. This novel method uses a multi-class classification process and introduces an efficient segmentation network...
Published: 11/29/2022   |   Inventor(s): Rongguang Liang, Junchao Zhang, Xiaobo Tian, Jianbo Shao
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology