Search Results - technology+classifications+%3e+imaging+%26+optics+%3e+optical+fab+%2f+metrology

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Consumer Optics with Low Cost Polymers
This invention describes a range of low-cost polymer compositions and method of making for high index, high Abbie number consumer optics. Background: The consumer eyewear global market estimated at greater than $100 billion. Current optical polymer technology revolves around well-established thermoplastic or thermoset polymers, including polycarbonates...
Published: 5/18/2022   |   Inventor(s): Dong-Chul Pyun, Robert Norwood, Jon Njardarson, Richard Glass, Taeheon Lee, Chisom Olikagu, Kyung Seok Kang
Keywords(s):  
Category(s): Technology Classifications > Materials > Chemicals, Technology Classifications > Materials > Polymers, Technology Classifications > Imaging & Optics > Lens & System Design, Technology Classifications > Imaging & Optics > Ophthalmology, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Interferometric System with Deep Learning Algorithm to Process Two Interferograms
This invention is a interferometric system that captures two interferograms and utilizes deep learning algorithm to process two interferograms. This invention enables the measurement of surface roughness and surface shape using the interferometric system and neural network to process the data. The deep learning portion of the system is in a compact...
Published: 11/3/2021   |   Inventor(s): Rongguang Liang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Freeform Surface Metrology with Deflectometry
Deflectometry is one of the potential techniques for freeform surface metrology. The display panel is either LCD, LED, or OLD and it displays a certain pattern onto the freeform surface. The cameras then record how the pattern is distorted on the surface and this is fed into a processing unit where it calculates the surface shape. This invention involves...
Published: 7/29/2020   |   Inventor(s): Rongguang Liang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Pseudo-Nulling Mach-Zehnder Metrology
This technology is a novel Mach-Zehnder interferometer that uses a a pseudo-nulling configuration with a converging beam, to test two optical components against each other, rather that testing one optical component against a reference component Background: As the capability of optical manufacturing has grown such that it is easy to mass produce...
Published: 6/22/2020   |   Inventor(s): Daewook Kim, Heejoo Choi, Trenton Brendel
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Virtual Deflectometry Enclosure Screen
This invention is a system designed to perform optical quality metrology on freeform or convex optics. This system provides a full aperture surface reconstruction sag map of freeform surfaces. The method relies on the creation of virtual source enclosure that surrounds the unit under testing (UUT) and produces a virtual 2 Pi-steradian measurement range....
Published: 3/11/2019   |   Inventor(s): Daewook Kim, Logan Graves
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Phase Unwrapping by Neural Network
This technology is a novel method for phase unwrapping in optical imaging in a more efficient and accurate way. It uses unwrapping algorithms based on a transport of an intensity equation with a convolutional neural network to unwrap the phase. This novel method uses a multi-class classification process and introduces an efficient segmentation network...
Published: 3/11/2019   |   Inventor(s): Rongguang Liang, Junchao Zhang, Xiaobo Tian, Jianbo Shao
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
3D Printing Freeform Optics
Researchers at the University of Arizona have developed a novel apparatus and method for additive 3D printing of visible wavelength optics. The materials used have a low refractive index, and the laser parameters are tailored to deliver high figure and surface quality, making the printer suitable for freeform optics and rapid prototyping of complex...
Published: 2/4/2017   |   Inventor(s): Rongguang Liang, Zhihan Hong
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Materials & Fabrication > Optical, EO & MO, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Instantaneous Phase Shifting Deflectometry
This technology is a device that instantaneously measures the slope of a surface. Modeled on the iOS smartphone platform, this device emits a light pattern towards an object and records the optical information reflected back in order to identify deflections in the object's surface shape. Background: Current deflectometry methods compare multiple...
Published: 2/4/2017   |   Inventor(s): Daewook Kim, Isaac Trumper
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Absolute Calibration of Slope Measuring Tests
Researchers at the University of Arizona have developed a system for testing the figure and finish of optical surfaces or any other curved surface using a Shack-Hartmann type of method, wherein a pattern can be projected onto the surface and then its returned image can be analyzed. The patterns can be varied to optimize the returned information regarding...
Published: 6/27/2015   |   Inventor(s): Robert Parks
Keywords(s): absolute testing, maximum likelihood, SCOTS, slope measuring optical tests
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
Axially Scanning to Determine Slopes of Aspheric Surfaces
Researchers at the University of Arizona have developed a system for testing the figure and finish of optical surfaces or any other curved surface using a Shack-Hartmann type of method, wherein a pattern can be projected onto the surface and then its returned image can be analyzed. The patterns can be varied to optimize the returned information regarding...
Published: 11/20/2014   |   Inventor(s): Robert Parks, Robert Smythe
Keywords(s): aspheric surface, optical testing, slope measurement, wavefronts
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Optical Fab / Metrology
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