Search Results - technology+classifications+%3e+imaging+%26+optics+%3e+sensors+and+detection+%3e+inspection

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Stick and Peel Probe for Analysis of Defects under Operando Conditions in Perovskite Materials for Manufacturing or Quality Control
A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or...
Published: 6/11/2021   |   Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong
Keywords(s):  
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Energy Collection, Storage & Battery, Technology Classifications > Energy, Cleantech & Environmental > Fuel Cells, Technology Classifications > Energy, Cleantech & Environmental > Manufacturing, Technology Classifications > Energy, Cleantech & Environmental > Low Carbon, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > MEMS & Nanotechnology, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Materials & Fabrication, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Chemicals, Technology Classifications > Materials > Nanomaterials, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls
Wave Front Sensor based on Fourier Filtering
This invention describes a sensor that can measure the wave front of an incoming electromagnetic wave. The sensor has application in semiconductor and precision optics metrology, ophthalmic diagnostic imaging, remote sensing and laser beam characterization. In addition, wave front sensor is a key component of adaptive optics system which is used in...
Published: 4/7/2021   |   Inventor(s): Stanley Pau, David Brady
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Remote Sensing, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
Real-Time Snake Detector Utilizing TensorFlow Lite API Mobile Application
This invention is a mobile application which could be used to detect and warn in real time, the presence of snakes utilizing machine learning software. Background: With increasing commercial and residential growth in places like Florida and Australia that have a great population of snakes, this construction is causing the reptiles' natural habitat...
Published: 2/4/2021   |   Inventor(s): Marco Tavera-Reyes, Carlos Field-Sierra
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Engineering & Physical Sciences > Communications & Networking > Wireless
Compact Snapshot Dual-Mode Interferometric System
This technology is an interferometric system that measures both surface shape and roughness and is designed for on-machine metrology. Background: Interferometry uses constructive and destructive interference in waves to obtain information. One common application of this field is to examine the properties of a surface, often at nanoscale. When mounted...
Published: 12/2/2020   |   Inventor(s): Rongguang Liang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
Air Transportation Luggage Security - Stochastic Bag Generator (SBG)
This technology is a method of modeling the response of a luggage inspection device based on a variety of contents and packing styles. The method is used to calibrate inspection instruments' responses, and predict successful inspection. This allows for better inspection machine design, decreases the number of bags pulled for secondary screening,...
Published: 6/13/2018   |   Inventor(s): Amit Ashok, James Huang
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
Polarization Plenoptic Imaging System and Application to 3D Reconstruction
Researchers at the University of Arizona have designed a polarization plenoptic camera that can record position, angle, wavelength, polarization and time, all in a single shot. Because of the novel application of polarizers, it can separate reflected light from transmitted light for a given surface, enable imaging of objects that are not in the direct...
Published: 5/11/2016   |   Inventor(s): Stanley Pau, Amit Ashok
Keywords(s):  
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Imaging & Optics > Sensors and Detection > Remote Sensing, Technology Classifications > Imaging & Optics > Microscopy, Spectroscopy, Polarimetry
SHG Imaging Technique for Assessing Hybrid EO Polymer/Silicon Photonic Integrated Circuits
Scientists at the University of Arizona have developed a system for assessing the efficiency of the electro-optic (EO) polymer poling process by using multi-photon imaging in the second harmonic generation mode (SHG), permitting imaging and assessment of waveguide devices, including poled polymer devices, prior to, during, and after fabrication. This...
Published: 2/9/2015   |   Inventor(s): Robert Norwood, Khanh Kieu, Roland Himmelhuber
Keywords(s): electro-optic polymer, hybrid photonic integrated circuits, SHG imaging, silicon photonics
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection
System and Method for Determining 3-Dimensional Location of Defects in a Uniaxial Crystal
This invention is an optical inspection system that utilizes polarimetry, specialized illumination and imaging techniques to avoid the inaccuracies caused by image doubling, ray splitting, and defects shadowing each other. This novel inspection system greatly improves the accuracy in identifying the location of defects within boules of birefringent...
Published: 6/26/2012   |   Inventor(s): Russell Chipman, Karlton Crabtree
Keywords(s): crystal, defect measurement, polarization
Category(s): Technology Classifications > Imaging & Optics, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection