Stick and Peel Probe for Analysis of Defects under Operando Conditions in Perovskite Materials for Manufacturing or Quality Control

Case ID:

A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices.  The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or a device stack.  The method may be used to analyze numerous characteristics, such as numbers of defects or defect density, stability, surface composition, band gap, physical structure, electroactivity, band bending, migration/diffusion process, and charging effects. This probe technology can be used in the manufacturing or analysis of thin film stacks to improve their performance and robustness.

As an example, perovskite solar cells represent an emerging category of thin film solar cells with very good prospects for becoming a replacement for not only other thin film solar technologies, but also as a substitute for crystalline silicon. Their efficiency has grown rapidly in a short time, leading to the conclusion that very high efficiencies can be achieved, higher than what is theoretically possible for other types of solar cells. The issue that these cells face are a short life span as they decrease in efficiency quickly compared to more traditional methods of harvesting solar energy. This tech has the ability to bring more understanding of the defect formation in perovskite films manufacturing, ultimately improving the stability and life span of thin film perovskite solar cells.


  • Semiconductor films and optoelectronics, including perovskite solar cells
  • Film, material, material blend, or device stack
  • Manufacturing, QC control
  • Field QC, maintenance, trouble-shooting


  • Simple "Stick and Peel" or incorporate in device
  • Enables manufacturing and field quality control
  • Improve and speed development of long-term stability of optoelectronic devices
  • Numerous material characteristics may be measured under operando conditions
  • Cost efficient
Patent Information:
Contact For More Information:
Laura Silva
Sr. Licensing Manager, COS
The University of Arizona
Lead Inventor(s):
Michel De Keersmaecker
Erin Ratcliff
Neal Armstrong