"Stick and Peel" Probe Properties of Perovskite Material Properties for Manufacturing Scale-Up and Quality Control

Case ID:

A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices.  The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or a device stack.  The method may be used to analyze numerous characteristics, such as numbers of defects or defect density, stability, surface composition, band gap, physical structure, electroactivity, band bending, migration/diffusion process, and charging effects. This probe technology can be used in the manufacturing or analysis of thin film stacks to improve their performance and robustness.

Perovskite solar cells have potential for becoming a replacement for not only other thin film solar technologies, but also as a substitute for crystalline silicon. Higher efficiencies can be achieved, potentially surpassing theoretical limits for solar cells. This technology improves the stability and life span of thin film perovskite solar cells. 


  • Semiconductor films and optoelectronics, including perovskite solar cells
  • Film, material, material blend, or device stack
  • Manufacturing, QC control
  • Field QC, maintenance, trouble-shooting


  • Simple "Stick and Peel" or incorporate in device
  • Cost efficient
  • Improve and speed development of long-term stability of optoelectronic devices
  • Numerous material characteristics may be measured under operando conditions
  • Enables manufacturing and field quality control
Patent Information:
Contact For More Information:
Jonathan Larson
Senior Licensing Manager, College of Science
The University of Arizona
Lead Inventor(s):
Michel De Keersmaecker
Erin Ratcliff
Neal Armstrong