Search Results - michel+de+keersmaecker

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Electrochemical Testing during High-Throughput Manufacturing of Solar Cells
A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices and configured for use in situ and/or in operando. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum...
Published: 3/30/2022   |   Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong
Keywords(s):  
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Energy Collection, Storage & Battery, Technology Classifications > Energy, Cleantech & Environmental > Fuel Cells, Technology Classifications > Energy, Cleantech & Environmental > Low Carbon, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Telecommunications > Electro-Optic Devices, Technology Classifications > Materials > Processing
Defect Characterization for Semiconductors, including Perovskites, in Operando or during Manufacturing, using 'Peel and Stick' Probe with Enhanced Sensitivity
A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or...
Published: 3/30/2022   |   Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong
Keywords(s):  
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Energy Collection, Storage & Battery, Technology Classifications > Energy, Cleantech & Environmental > Fuel Cells, Technology Classifications > Energy, Cleantech & Environmental > Low Carbon, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Telecommunications > Electro-Optic Devices, Technology Classifications > Materials > Processing
Stick and Peel Probe for Analysis of Defects under Operando Conditions in Perovskite Materials for Manufacturing or Quality Control
A “stick and peel” removable electrochemical probe is used for solvent-free characterization of semiconductor films or optoelectronic devices. The invention may be used to analyze electronic materials such as a metal halide perovskite, an organic semiconductor, a nanocrystalline (quantum dot) thin film, metal oxides, a material blend or...
Published: 6/11/2021   |   Inventor(s): Michel De Keersmaecker, Erin Ratcliff, Neal Armstrong
Keywords(s):  
Category(s): Technology Classifications > Energy, Cleantech & Environmental > Energy Collection, Storage & Battery, Technology Classifications > Energy, Cleantech & Environmental > Fuel Cells, Technology Classifications > Energy, Cleantech & Environmental > Manufacturing, Technology Classifications > Energy, Cleantech & Environmental > Low Carbon, Technology Classifications > Energy, Cleantech & Environmental > Renewable Energy > Solar/Photovoltaic, Technology Classifications > Engineering & Physical Sciences > MEMS & Nanotechnology, Technology Classifications > Engineering & Physical Sciences > Semiconductors, Technology Classifications > Imaging & Optics > Materials & Fabrication, Technology Classifications > Imaging & Optics > Sensors and Detection, Technology Classifications > Imaging & Optics > Sensors and Detection > Inspection, Technology Classifications > Materials > Chemicals, Technology Classifications > Materials > Nanomaterials, Technology Classifications > Materials > Processing, Technology Classifications > Sensors & Controls